Beam Damage Localization Method Considering Random Uncertainty Using Mid-Span Displacement Data

Random uncertainty is recognized as one of the main barriers against the application of existing damage detection techniques on actual structures. This paper investigates the damage localization of simply supported beams with original random uncertainty. A new index, DIILMSD, which is based on the idea of "Second Order Difference of Displacement Influence Line", has been presented. The damage localization method based on DIILMSD has been theoretically discussed and its application to the random uncertain case is studied as a highlight. Numerical examples have been conducted to examine the suitability of the method. It is proved that this method can work in the presence of random uncertainty in geometric and material properties, which means that it is suitable for real-world beams. Another significant attraction of this method is that only mid-span displacement measurements are required during the application process of this method.