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Apr 26, 2012
Development of Atmospheric Electron-Induced X-Ray Spectrometer (AEXS) Instrument with High Spatial Resolution for Surface Elemental Analysis in Planetary Atmosphere
Authors: Eduardo Urgiles, Jaroslava Wilcox [email protected], Risaku Toda, Joy Crisp, and Martin BuehlerAuthor Affiliations
Publication: Earth & Space 2008: Engineering, Science, Construction, and Operations in Challenging Environments
Abstract
One of the most powerful techniques for the characterization of mineral samples is Electron-induced Energy-Dispersive X-ray Fluorescence Spectroscopy (EDX-XRF). If used for resolving the elemental composition for samples in their natural state, high spatial resolution data will provide insight into geological processes and formation mechanisms of planets and other solar system objects. By correlating the XRF with other spectra (eg XUV and optical luminescence) additional information could be obtained about the bonding structure and oxidation states for the minerals. To date, all in situ missions have carried some form of an XRF instrument. For example, the APXS instrument aboard the Mars Pathfinder and MER determined bulk" averaged elemental composition over areas of several cm in diameter. The spectrum acquisition time required to resolve the XRF spectrum was several hours. In order to obtain spatial maps, the spectrum acquisition time must be decreased and the spatial resolution of future XRF instruments increased in comparison to the current methods.
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© 2008 American Society of Civil Engineers.
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Published online: Apr 26, 2012
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Eduardo Urgiles
M/S 301-231, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109
M/S 301-231, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109. E-mail: [email protected]
Risaku Toda
M/S 301-231, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109
Joy Crisp
M/S 301-231, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109
Martin Buehler
M/S 301-231, Jet Propulsion Laboratory, 4800 Oak Grove Dr., Pasadena, CA 91109
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