Correlating Long-Term Chip Seals Performance and Rheological Properties of Aged Asphalt Binders
Publication: Journal of Materials in Civil Engineering
Volume 28, Issue 5
Abstract
Two most common distresses found in chip seals are raveling and bleeding. Although raveling is a process that continues throughout the whole service life of chip seals, current performance tests available for chip seals focus mainly on early raveling and bond maturation. In this study, chip seals binders from the field were extracted and recovered for two consecutive years. Rheological properties of original, field-aged, and laboratory-aged binders were compared. Results showed that pressurized aging vessel (PAV-) aging simulates 3 to 4 years of field-aging for hot asphalt and less than 3 years for emulsion. Strain tolerance, shear stress at failure, oxidative aging index, and yield energy of the binder were correlated with long term field performance (raveling). Shear stress at failure of field-aged binders showed strong correlation with long-term field performance, exhibiting an value of 0.95. However, yield energy (a product of strain tolerance and shear stress at failure) of original binder, which showed an value of 0.83 with long-term field distress rating (raveling), was recommended as performance parameter for chip seals binder.
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Acknowledgments
This project was funded by the Louisiana Transportation Research Center (LTRC). The authors sincerely acknowledge their support and contributions.
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Information
Published In
Journal of Materials in Civil Engineering
Volume 28 • Issue 5 • May 2016
Copyright
© 2015 American Society of Civil Engineers.
History
Received: Nov 26, 2014
Accepted: Sep 21, 2015
Published online: Nov 18, 2015
Discussion open until: Apr 18, 2016
Published in print: May 1, 2016
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