TECHNICAL PAPERS
Sep 1, 1996

Effect of Sampling Variability on Hindcast and Measured Wave Heights

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Publication: Journal of Waterway, Port, Coastal, and Ocean Engineering
Volume 122, Issue 5

Abstract

Estimates of significant wave heights made from finite record lengths have a small but important statistical sampling variability. This variability leads to positive biases in the maximum significant wave height in a storm and in design wave heights estimated from extreme value distributions fitted to the data. Since wave hindcasts are often verified by comparing the maximum hindcast and measured significant wave heights in a storm, the bias due to sampling variability can make a correct hindcast appear to be too low. In this paper we show how the magnitude of the biases can be calculated from the sample length and the shape of the wave spectrum. These theoretical calculations agree very well with results from several sets of measurements in the North Sea. We recommend that new wave measurements be recorded continuously whenever possible, and that hindcast verifications and extreme wave calculations be made with smoothed versions of the measured time series of significant wave height.

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References

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Go to Journal of Waterway, Port, Coastal, and Ocean Engineering
Journal of Waterway, Port, Coastal, and Ocean Engineering
Volume 122Issue 5September 1996
Pages: 216 - 225

History

Published online: Sep 1, 1996
Published in print: Sep 1996

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Authors

Affiliations

George Z. Forristall
Shell Int. Exploration and Production, Postbus 162, 2501 AN Den Haag, The Netherlands.
John C. Heideman
Exxon Production Res. Co., P.O. Box 2189, Houston, TX 77252–2189, USA.
Ian M. Leggett
Shell U.K. Exploration and Production, 1 Altens Farm Road, Nigg, Aberdeen AB9 2HY, UK.
Bram Roskam
Nat. Inst. for Coast. and Marine Mgmt., Rijkswaterstaat, Postbus 20907, 2500 EX Den Haag, The Netherlands.
Luc Vanderschuren
Shell Res., Rijswijk, The Netherlands.

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