Electromechanical Behavior of Interface Deformable Piezoelectric Bilayer Beams
Publication: Journal of Engineering Mechanics
Volume 136, Issue 4
Abstract
An interface deformable piezoelectric bilayer beam model is proposed to study the electromechanical responses and interface stress distributions in an intelligent layered structure. Like most of current approaches in the literature, the layerwise approximation of electric potential is employed. While in contrast to the linear approximation where the induced electric field is ignored, the present model takes a quadratic variation of the potentials across the thickness, thus warranting an efficient and accurate modeling of the electric field. Completely different from the widely used equivalent single layer model, in which the whole laminate is assumed to deform as a single layer and thus has a smooth variation of the displacement field over the thickness, the present model considers each sublayer as a single linearly elastic Timoshenko beam perfectly bonded together and therefore with individual deformations. To ensure the continuity of deformations of two adjacent sublayers along the interface, two interface compliance coefficients are introduced, by which both the longitudinal and vertical displacement components along the interface of two sublayers due to the interface shear and normal stresses are taken into account. To assess the performance of the present model, a number of benchmark tests are performed for a piezoelectric bimorph and a piezoelectric-elastic bilayer beam subjected to (1) a force density normal to the upper face and (2) an electric potential applied to the top and bottom faces. A remarkable agreement achieved between the present solution and the finite element computations illustrates the validity of the present study. The present model not only predicts well the global responses (displacement, electric charge, etc.), but also provides excellent estimates of the local responses (through-thickness variations of electromechanical state, interface stress distributions, etc.) of the piezoelectric layered structures. The novel mechanics model of electroelastic layered structures presented can be used to efficiently and effectively characterize hybrid smart devices and develop/optimize new multifunctional materials.
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Acknowledgments
This study is partially supported by the Special Fund of State Key Laboratory of Hydrology–Water Resources and Hydraulic Engineering at Hohai University (No. 2009585912). The writers gratefully acknowledge the support from Hohai University to this study and thank the Changjiang (Cheung Kong) Distinguished Scholar Award from the Ministry of Education of the People’s Republic of China.
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Information & Authors
Information
Published In
Journal of Engineering Mechanics
Volume 136 • Issue 4 • April 2010
Pages: 413 - 428
Copyright
© 2010 ASCE.
History
Received: Aug 3, 2008
Accepted: Aug 18, 2009
Published online: Mar 15, 2010
Published in print: Apr 2010
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