Technical Papers
Sep 10, 2015

Equivalent Stress Transformation for Efficient Probabilistic Fatigue-Crack Growth Analysis under Variable Amplitude Loadings

Publication: Journal of Aerospace Engineering
Volume 29, Issue 2

Abstract

A general probabilistic fatigue-crack growth prediction methodology for accurate and efficient damage prognosis is proposed in this paper. The methodology is based on an equivalent stress transformation and the inverse first-order reliability method (IFORM). The equivalent stress transformation aims to transform the random variable amplitude loading to an equivalent constant amplitude loading spectrum. The proposed transformation avoids the cycle-by-cycle calculation under general random variable amplitude loadings. An IFORM is used to evaluate the probabilistic fatigue-crack growth behavior and to further enhance the computational efficiency. The computational cost of the proposed study is significantly reduced compared with the direct Monte Carlo simulation. Thus, the proposed method is very suitable for real-time damage prognosis because of its high computational efficiency. Numerical examples are used to demonstrate the proposed method. Various experimental data under variable amplitude loadings are collected for model validation.

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Acknowledgments

The research reported in this paper was supported by funds from the Air Force Office of Scientific Research: Young Investigator Program (Contract No. FA9550-11-1-0025, Project Manager: Dr. David Stargel). The support is gratefully acknowledged.

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Go to Journal of Aerospace Engineering
Journal of Aerospace Engineering
Volume 29Issue 2March 2016

History

Received: Apr 25, 2013
Accepted: Jan 12, 2015
Published online: Sep 10, 2015
Discussion open until: Feb 10, 2016
Published in print: Mar 1, 2016

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Authors

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Yibing Xiang, M.ASCE
Postdoctoral Research Associate, Univ. of Massachusetts, 42D Marston Hall, Amherst, MA 01003.
Yongming Liu, A.M.ASCE [email protected]
Associate Professor, Arizona State Univ., 501 E. Tyler Mall, Tempe, AZ 85281 (corresponding author). E-mail:[email protected]

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